Journal of Research of the National Institute of Standards and Technology

Volume 114

Number 4

July-August 2009

Cover Explanation:

The cover image shows a finite element model of a Critical Dimension-Atomic Force Microscopy (CD-AFM) probe and magnified tip. The model provides an analytical means to characterize static and dynamic behaviors of the probe and its tip when the tip is interacting with the sample surface during scanning. See the paper by Feng et al. of this issue for more information. Cover by C. Carey

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Date Created: August 5, 2009
Last Modifed: August 12, 2009