Volume 103 Number 5 September-October 1998

Front Cover–Title Page–ContentsPDF File 26 kb


The 1996 North American Interagency Intercomparison of Ultraviolet Monitoring Spectroradiometers PDF File 417 kb
Edward Early, Ambler Thompson, Carol Johnson, John DeLuisi, Patrick Disterhoft, David Wardle, Edmund Wu, Wanfeng Mou, James Ehramjian, John Tusson, Tanya Mestechkina, Mark Beaubian, James Gibson, and Douglas Hayes

Image Evaluation of the High Resolution VUV Spectrometer at SURF II by Ray Tracing PDF File 164 kb
N. C. Das, R. P. Madden, and H. M. Seyoum

Algorithms for Fresnel Diffraction at Rectangular and Circular Apertures PDF File 179 kb
Klaus D. Mielenz

Acid-Assisted Consolidation of Silver Alloys for Direct Fillings PDF File 39 kb
Frederick D. Eichmiller, Kathleen M. Hoffman, Anthony A. Guiseppetti, Michael M. Wray, and Rangall J. Avers

Gaseous Dielectrics VIII (Eighth International Symposium on Gaseous Dielectrics) PDF File 12 kb
Loucas G. Christophorou, and James K. Olthoff

NIST Workshop on Process Information Technology: From Research to Industry PDF File 73 kb
Howard T. Moncarz, Craig Schlenoff, Michael Gruninger, Michael Duffey, and Amy Knutilla

Refrigerants for the 21st Century ASHRAE/NIST Refrigerants Conference PDF File 36 kb
Piotr A. Domanski

Workshop on Knowledge-Based Systems Interoperability PDF File 28 kb
Robert H. Allen and Ram D. Sriram

News Briefs PDF File 265 kb

(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)