Volume 102 Number 4 July-August 1997

Front Cover–Title Page–ContentsPDF File 40 kb


A Complete Multimode Equivalent-Circuit Theory for Electrical Design PDF File 413 kb
Dylan F. Williams, Leonard A. Hayden, and Roger B. Marks

Algorithm for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation PDF File 706 kb
J. S. Villarrubia

Standardization of 63Ni by 4-pi-beta Liquid Scintillation Spectrometry With 3H-Standard Efficiency Tracing PDF File 251 kb
B. E. Zimmerman and R. Collé

Calibration of High Heat Flux Sensors at NIST PDF File 453 kb
A. V. Murthy, B. K. Tsai, and C. E. Gibson

Workshop on Advanced Methods and Models for Appearance of Coatings and Coated Objects - Conference Report PDF File 174 kb
Mary E. McKnight, Jonathan W. Martin, Michael Galler, Fern Y. Hunt, Robert R. Lipman, Theodore V. Vorburger, and Ambler Thompson

News Briefs PDF File 286 kb

(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)