Journal of Research of
the
National Institute of
Standards and Technology
Volume 115 | Number 1 | January-February 2010 |
An Iterative Image Registration Algorithm by
Optimizing Similarity Measurement
287 kb
http://dx.doi.org/10.6028/jres.115.001
Comparison Between the NIST and the KEBS
for the Determination of Air Kerma Calibration
Coefficients for Narrow X-Ray Spectra and
137Cs Gamma-Ray Beams
131 kb
http://dx.doi.org/10.6028/jres.115.002
Improving Interoperability by Incorporating
UnitsML Into Markup Languages
1,196 kb
http://dx.doi.org/10.6028/jres.115.003
Assessment of Uncertainties for the
NIST 1016 mm Guarded-Hot-Plate Apparatus:
Extended Analysis for Low-Density
Fibrous-Glass Thermal Insulation
1,070 kb
http://dx.doi.org/10.6028/jres.115.004