Journal of Research of
the
National Institute of
Standards and Technology
Volume 104 | Number 4 | July-August 1999 |
Front Cover–Title Page–Contents 26 kb
Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements
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239 kb
http://dx.doi.org/10.6028/jres.104.023
A Conceptual Data Model of Datum Systems
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259 kb
http://dx.doi.org/10.6028/jres.104.024
Second Advanced Encryption Standard Candidate Conference
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55 kb
http://dx.doi.org/10.6028/jres.104.025
(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)