Cover Image of the Journal of Research

Volume 112 Number 5 September-October 2007 RSS image


Electro-Physical Technique for Post-Fabrication Measurements of CMOS Process Layer Thicknesses PDF File 957 kb
Janet C. Marshall and P. Thomas Vernier

Measurement Tools for the Immersive Visualization Environment: Steps Toward the Virtual Laboratory PDF File 1787 kb
John G. Hagedorn, Joy P. Dunkers, Steven G. Satterfield, Adele P. Peskin, John T. Kelso, and Judith E. Terrill

Convective Instabilities in Two Liquid Layers PDF File 300 kb
G. B. McFadden, S. R. Coriell, K. F. Gurski, and D. L. Cotrell

Comparison Between NIST and AF Laser Energy Standards Using High Power Lasers PDF File 588 kb
Xiaoyu Li, Thomas Scott, Chris Cromer, David Cooper, and Steven Comisford