cover image of the Journal of Research

Volume 112 Number 1 January-February 2007 RSS image


20 °C—A Short History of the Standard Reference Temperature for Industrial Dimensional Measurements PDF File 2553 kb
Ted Doiron

Will Future Measurement Needs of the Semiconductor Industry Be Met? PDF File 623 kb
Herbert S. Bennett

“Once is Enough” in Radiometric Calibrations PDF File 1120 kb
Gerald T. Fraser, Charles E. Gibson, Howard W. Yoon, and Albert C. Parr

“A Doubt is at Best an Unsafe Standard”: Measuring Sugar in the Early Bureau of Standards PDF File 1269 kb
David Singerman

Complex Permittivity of Planar Building Materials Measured With an Ultra-Wideband Free-Field Antenna Measurement System PDF File 746 kb
Ben Davis, Chriss Grosvenor, Robert Johnk, David Novotny, James Baker-Jarvis, and Michael Janezic