M
|
|
magnetic dipole bands
|
 133(1)
|
|
magnetic field
|
557(4)
|
|
magnetic rotation
|
53(1)
|
|
manufacturing simulation
|
783(5)
|
|
manufacturing simulation
|
783(5)
|
|
massic activity
|
535(4)
|
|
material properties
|
709(5)
|
|
measurement system comparisons
|
511(4)
|
|
mechanical properties
|
709(5)
|
|
median
|
551(4)
|
|
melding functions
|
433(3)
|
|
melding functions
|
445(3)
|
|
mercury ion
|
829(6)
|
|
message passing
|
343(3)
|
|
message passing interface
|
875(6)
|
|
metal detector
|
557(4)
|
|
metals
|
71(1)
|
|
metrology
|
839(6)
|
|
mineral saturation
|
267-273(2)
|
|
modem design
|
721(5)
|
|
molar Planck constant
|
11(1)
|
|
Molecular Dynamics simulations
|
81(1)
|
|
molecular dynamics simulations
|
71(1)
|
|
molecular ion
|
293(2)
|
|
Monte Carlo simulation
|
113(1)
|
|
MPI
|
343(3)
|
|
MPI
|
875(6)
|
|
multiphonon states
|
107(1)
|
N
|
|
NBS
|
535(4)
|
|
near infrared
|
689(5)
|
|
neutrino bursts
|
97(1)
|
|
neutrino helicity
|
89(1)
|
|
neutron capture
|
113(1)
|
|
neutron deficient nuclei
|
43(1)
|
|
neutron mass
|
11(1)
|
|
neutron reactions
|
173(1)
|
|
neutron-proton pairing
|
33(1)
|
|
New Yale Plunger Device
|
53(1)
|
|
NIST
|
535(4)
|
|
noise
|
209(2)
|
|
non-linear HPA
|
721(5)
|
|
normal modes
|
159(1)
|
|
nuclear level lifetimes
|
53(1)
|
|
nuclear levels
|
113(1)
|
|
nuclear lifetimes
|
81(1)
|
|
nuclear phase transitions
|
147(1)
|
|
nuclear resonance photon scattering
|
159(1)
|
|
nuclear spectroscopy
|
167(1)
|
|
nuclear state lifetimes
|
25(1)
|
|
nuclear structure
|
141(1)
|
|
nuclear structure
|
25(1)
|
|
nuclear structure
|
53(1)
|
|
nuclear structure
|
33(1)
|
|
numerical approximations
|
589(4)
|
|
numerical integration
|
581(4)
|
O
|
|
optical discs
|
565(4)
|
|
optical fiber Bragg grating
|
839(6)
|
|
optical fiber sensors
|
839(6)
|
|
optical frequency standards
|
829(6)
|
P
|
|
parallel processing
|
343(3)
|
|
parallel processing
|
875(6)
|
|
phase coexistence
|
147(1)
|
|
phonon creation
|
89(1)
|
|
phonon excitations
|
125(1)
|
|
phonon states
|
147(1)
|
|
photocurrent
|
209(2)
|
|
photocurrent
|
813(6)
|
|
photodiode
|
813(6)
|
|
physical properties
|
709(5)
|
|
plaque fluid
|
267-273(2)
|
|
potentiometer
|
755(5)
|
|
potentiometer
|
755(5)
|
|
pragmatic TCM
|
721(5)
|
|
precision measurement
|
1(1)
|
|
primary standard
|
701(5)
|
|
process representation
|
783(5)
|
|
process representation
|
783(5)
|
|
product data management
|
783(5)
|
|
product data management
|
783(5)
|
|
prolate deformation
|
43(1)
|
|
prototypes
|
307(2)
|
|
prototypes
|
307(2)
|
R
|
|
radiant power
|
813(6)
|
|
radioactive beams
|
33(1)
|
|
radioactive hafnium
|
125(1)
|
|
radioactive lifelines
|
101(1)
|
|
radioactivity
|
275(2)
|
|
radiometer
|
209(2)
|
|
radiometer
|
293(2)
|
|
radiometry
|
689(5)
|
|
rapid chloride test
|
497-(4)
|
|
rapid chloride test
|
497-(4)
|
|
rapid chloride test
|
497(4)
|
|
recoil distance method
|
53(1)
|
|
recoil-distance method
|
63(1)
|
|
rectangular coils
|
557(4)
|
|
recursion formula
|
581(4)
|
|
reference detector
|
813(6)
|
|
reference materials
|
571(4)
|
|
reference radiation qualities
|
701(5)
|
|
reflectance
|
839(6)
|
|
regression analyses
|
433(3)
|
|
regression analyses
|
445(3)
|
|
relative group delay
|
839(6)
|
|
resonance neutrons
|
173(1)
|
|
responsivity
|
689(5)
|
|
responsivity
|
813(6)
|
|
review
|
541(4)
|
|
robust statistics
|
551(4)
|
S
|
|
saliva
|
267-273(2)
|
|
scanning electron microscopy
|
867(6)
|
|
scanning electron microscopy
|
867(6)
|
|
scientific visaualization
|
875(6)
|
|
scintillation counter
|
275(2)
|
|
second virial
|
667-688(5)
|
|
sensitivity
|
209(2)
|
|
sensor
|
293(2)
|
|
series expansions
|
589(4)
|
|
shear bands
|
53(1)
|
|
silicon photodiodes
|
209(2)
|
|
slit
|
581(4)
|
|
slowing down
|
71(1)
|
|
software integration
|
783(5)
|
|
software integration
|
783(5)
|
|
spatial statistics
|
511(4)
|
|
spectral response
|
813(6)
|
|
spherical nuclei
|
107(1)
|
|
standard cell comparator
|
755(5)
|
|
standard cell comparator
|
755(5)
|
|
standard deviation
|
565(4)
|
|
standard deviations
|
433(3)
|
|
standard deviations
|
445(3)
|
|
standard reference material
|
511(4)
|
|
standards
|
631(4)
|
|
standards
|
631(4)
|
|
standards
|
535(4)
|
|
Stark shift
|
829(6)
|
|
superdeformed bands
|
153(1)
|
|
supernovae
|
101(1)
|
|
supernovae
|
97(1)
|
|
surface measurement
|
511(4)
|
|
surveillance systems
|
557(4)
|
|
systems integration
|
783(5)
|
|
systems integration
|
783(5)
|
T
|
|
test method
|
511(4)
|
|
thallium
|
153(1)
|
|
thermal conductivity
|
591(4)
|
|
thermal conductivity
|
667-688(5)
|
|
thermal diffusion factor
|
667-688(5)
|
|
thermal properties
|
709(5)
|
|
thermal-barrier coating
|
591(4)
|
|
thermophysical standards
|
667-688(5)
|
|
thorium
|
275(2)
|
|
tilted-axis crancking model
|
133(1)
|
|
titanium diboride
|
709(5)
|
|
total ionization cross sections
|
293(2)
|
|
transfer standard
|
813(6)
|
|
transmittance
|
839(6)
|
|
transport properties
|
667-688(5)
|
|
tritiated water
|
535(4)
|
|
tritium
|
535(4)
|
|
tritium
|
541(4)
|
U
|
|
uncertainty
|
571(4)
|
|
uncertainty
|
551(4)
|
|
uranium
|
275(2)
|
V
|
|
variance
|
551(4)
|
|
viscosity
|
667-688(5)
|
W
|
|
wevelngth division multiplexing
|
839(6)
|
|
workshop
|
631(4)
|
|
workshop
|
631(4)
|
X
|
|
x-ray microscopy
|
867(6)
|
|
x-ray microscopy
|
867(6)
|
|
XML
|
783(5)
|
|
XML
|
783(5)
|
Y
|
|
YAlO^d3^
|
177(1)
|
|
yttria-stabilized-zirconia
|
591(4)
|
Z
|
|
Zeeman shift
|
829(6)
|
|
zero-point energy
|
159(1)
|
|
ZnS
|
81(1)
|
{
|
|
{gamma}-spectroscopy
|
133(1)
|
|
{gamma}{gamma}-coincidences
|
141(1)
|