M
|
|
magnetic anisotropy
|
 261(3)
|
|
magnetic microstructure
|
261(3)
|
|
magnetism
|
261(3)
|
|
measurement
|
141(2)
|
|
measurement
|
141(2)
|
|
measurement assurance
|
225(3)
|
|
measurement assurance
|
225(3)
|
|
measurement uncertainty
|
225(3)
|
|
measurement uncertainty
|
225(3)
|
|
mercury point
|
11(1)
|
|
micromagnetics
|
261(3)
|
|
microwave propagation
|
579(6)
|
|
microwave resonator
|
11(1)
|
|
mobile ad hoc networks
|
587(6)
|
|
mortar
|
461-478(5)
|
|
multi-series connections
|
529(6)
|
|
multi-series connections
|
323(4)
|
|
multiple diffraction
|
579(6)
|
N
|
|
nanocrystalline materials
|
261(3)
|
|
National Metrology Institute
|
105(5)
|
|
National Metrology Institute
|
105(5)
|
|
National standards strategy
|
83(1)
|
|
near infrared spectroscopy
|
173(2)
|
|
neutron scattering
|
261(3)
|
|
numeric integration
|
189(2)
|
|
numeric transform
|
189(2)
|
O
|
|
OMB Circular A-119
|
91(1)
|
|
ontology
|
495(5)
|
P
|
|
parametric downconversion
|
1(1)
|
|
parametric downconversion
|
1(1)
|
|
parasitic impedances
|
529(6)
|
|
pb-doped 2223
|
277(3)
|
|
Petzval
|
479(5)
|
|
phase equilibria
|
277(3)
|
|
photometer, photometry
|
47(1)
|
|
physical phenomena
|
105(5)
|
|
physical phenomena
|
105(5)
|
|
plastics
|
557(6)
|
|
plastics
|
557(6)
|
|
polarization interferometer
|
1(1)
|
|
polarization interferometer
|
1(1)
|
|
polarization mode dispersion (PMD)
|
1(1)
|
|
polarization mode dispersion (PMD)
|
1(1)
|
|
power efficiency
|
587(6)
|
|
pressed polytetrafluoroethylene powder
|
185(2)
|
|
primary phase field
|
277(3)
|
|
primary standard
|
135(2)
|
|
process ontology
|
495(5)
|
|
process semantics
|
495(5)
|
|
process specification language
|
495(5)
|
|
product data standards
|
291(3)
|
|
PSL
|
495(5)
|
Q
|
|
quantized Hall resistance
|
529(6)
|
|
quantized Hall resistance
|
323(4)
|
|
quantum interference
|
1(1)
|
|
quantum interference
|
1(1)
|
R
|
|
radiance temperature
|
253-259(3)
|
|
radiance temperature
|
253-259(3)
|
|
radiant flux
|
479(5)
|
|
Rayleigh
|
479(5)
|
|
reference radiation qualities
|
135(2)
|
|
relaxation function
|
189(2)
|
|
resolution
|
479(5)
|
|
rf furnace
|
253-259(3)
|
|
rf furnace
|
253-259(3)
|
|
rheological measurements
|
461-478(5)
|
|
rheological models
|
461-478(5)
|
|
rheology
|
461-478(5)
|
S
|
|
sensor
|
487(5)
|
|
small-angle neutron scattering
|
261(3)
|
|
software metrics
|
567(6)
|
|
spin-wave stiffness
|
261(3)
|
|
standard
|
83(1)
|
|
standards
|
91(1)
|
|
standards policy
|
83(1)
|
|
standards strategy
|
83(1)
|
|
standards summit
|
83(1)
|
|
steel
|
557(6)
|
|
steel
|
557(6)
|
|
superconductor related materials
|
147(2)
|
|
suspension
|
461-478(5)
|
T
|
|
technical standards
|
91(1)
|
|
test methods
|
461-478(5)
|
|
time domain
|
189(2)
|
|
transfer calibration
|
487(5)
|
|
tree
|
579(6)
|
U
|
|
units
|
47(1)
|
V
|
|
V-notch
|
557(6)
|
|
V-notch
|
557(6)
|
|
vegetation
|
579(6)
|
|
verification
|
557(6)
|
|
verification
|
557(6)
|
W
|
|
wireless communications
|
579(6)
|
|
workability
|
461-478(5)
|
X
|
|
x-ray and neutron Rietveld refinements
|
147(2)
|
|
x-ray reference powder patterns
|
147(2)
|