Journal of Research of
the
National Institute of
Standards and Technology
| Volume 112 | Number 5 | September-October 2007 |
|
Electro-Physical Technique for
Post-Fabrication Measurements of
CMOS Process Layer Thicknesses 
957 kb
http://dx.doi.org/10.6028/jres.112.018
Measurement Tools for the Immersive
Visualization Environment: Steps Toward the
Virtual Laboratory
1787 kb
http://dx.doi.org/10.6028/jres.112.019
Convective Instabilities in
Two Liquid Layers
300 kb
http://dx.doi.org/10.6028/jres.112.020
Comparison Between NIST and AF Laser
Energy Standards Using High Power Lasers
588 kb
http://dx.doi.org/10.6028/jres.112.021