Volume 112

Number 1

January-February 2007

Articles

20 °C—A Short History of the Standard Reference Temperature for Industrial Dimensional Measurements 2553 kb
Ted Doiron
http://dx.doi.org/10.6028/jres.112.001

Will Future Measurement Needs of the Semiconductor Industry Be Met? 623 kb
Herbert S. Bennett
http://dx.doi.org/10.6028/jres.112.002

“Once is Enough” in Radiometric Calibrations 1120 kb
Gerald T. Fraser, Charles E. Gibson, Howard W. Yoon, and Albert C. Parr
http://dx.doi.org/10.6028/jres.112.003

“A Doubt is at Best an Unsafe Standard”: Measuring Sugar in the Early Bureau of Standards 1269 kb
David Singerman
http://dx.doi.org/10.6028/jres.112.004

Complex Permittivity of Planar Building Materials Measured With an Ultra-Wideband Free-Field Antenna Measurement System 746 kb
Ben Davis, Chriss Grosvenor, Robert Johnk, David Novotny, James Baker-Jarvis, and Michael Janezic
http://dx.doi.org/10.6028/jres.112.005