Volume 109 Number 5 September-October 2004

Front Cover–Title Page–ContentsPDF File 736 kb

Articles

Optical Diffraction in Close Proximity to Plane Apertures. III. Modified, Self-Consistent Theory PDF File 581 kb
Klaus D. Mielenz
http://dx.doi.org/10.6028/jres.109.033

Development of A High Throughput Method Incorporating Traditional Analytical Devices PDF File 806 kb
C. C. White, E. Embree, W. E. Byrd, and A. R. Patel
http://dx.doi.org/10.6028/jres.109.034

Determining the Uncertainty of X-Ray Absorption Measurements PDF File 664 kb
Gary S. Wojcik
http://dx.doi.org/10.6028/jres.109.035

Analytical Representations of Elastic Moduli Data With Simultaneous Dependence on Temperature and Porosity PDF File 552 kb
R. G. Munro
http://dx.doi.org/10.6028/jres.109.036

Electron-Impact Cross Sections for Ground State to np Excitations of Sodium and Potassium PDF File 750 kb
Philip M. Stone and Yong-Ki Kim
http://dx.doi.org/10.6028/jres.109.037

Stability Comparison of Recordable Optical Discs--A Study of Error Rates in Harsh Conditions PDF File 654 kb
Oliver Slattery, Richang Lu, Jian Zheng, Fred Byers, and Xiao Tang
http://dx.doi.org/10.6028/jres.109.038



Subscription Information PDF File 1100 kb

(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)