Journal of Research of
the
National Institute of
Standards and Technology
Volume 109 | Number 5 | September-October 2004 |
Front Cover–Title Page–Contents 736 kb
Optical Diffraction in Close Proximity to Plane Apertures. III. Modified, Self-Consistent Theory
581 kb
http://dx.doi.org/10.6028/jres.109.033
Development of A High Throughput Method Incorporating Traditional Analytical Devices
806 kb
http://dx.doi.org/10.6028/jres.109.034
Determining the Uncertainty of X-Ray Absorption Measurements
664 kb
http://dx.doi.org/10.6028/jres.109.035
Analytical Representations of Elastic Moduli Data With Simultaneous Dependence on Temperature and Porosity
552 kb
http://dx.doi.org/10.6028/jres.109.036
Electron-Impact Cross Sections for Ground State to np Excitations of Sodium and Potassium
750 kb
http://dx.doi.org/10.6028/jres.109.037
Stability Comparison of Recordable Optical Discs--A Study of Error Rates in Harsh Conditions
654 kb
http://dx.doi.org/10.6028/jres.109.038
(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)