Journal of Research of
the
National Institute
of
Standards and Technology
Volume 109 | Number 2 | March-April 2004 |
Front CoverTitle PageContents 1130kb
The Remarkable
Metrological History of Radiocarbon Dating [II]
3829 kb
L. A.
Currie
http://dx.doi.org/10.6028/jres.109.013
Characterization of
Combinatorial Polymer Blend Composition Gradients by FTIR Microspectroscopy
2906 kb
Naomi Eidelman and
Carl G. Simon, Jr.
http://dx.doi.org/10.6028/jres.109.014
Spot Weld Analysis With 2D
Ultrasonic Arrays
1348 kb
A. A. Denisov, C.
M. Shakarji, B. B. Lawford, R. Gr. Maev, and J. M. Paille
http://dx.doi.org/10.6028/jres.109.015
Standard Reference
Materials (SRMs) for the Calibration and Validation of Analytical Methods for
PCBs (as Aroclor Mixtures)
2303 kb
Dianne L. Poster,
Michele M. Schantz, Stefan D. Leigh, and Stephen A. Wise
http://dx.doi.org/10.6028/jres.109.016
Simulation of Sheared
Suspenions With a Parallel Implementation of QDPD
850 kb
James S. Sims and
Nicos Martys
http://dx.doi.org/10.6028/jres.109.017
Software Architecture for
a Virtual Environment for Nano Scale Assembly (VENSA)
802 kb
Yong-Gu Lee, Kevin
W. Lyons, and Shaw C. Feng
http://dx.doi.org/10.6028/jres.109.018
Intramural Comparison of
NIST Laser and Optical Fiber Power Calibrations
1121 kb
John H. Lehman,
Igor Vayshenker, David J. Livigni, and Joshua Hadler
http://dx.doi.org/10.6028/jres.109.019
Erratum: Statistical
Interpretation of Key Comparison Reference Value and Degrees of Equivalence
465 kb
R. N. Kacker, R. U.
Datla, and A. C. Parr
http://dx.doi.org/10.6028/jres.109.020
Erratum: New National
Air-Kerma-Strength Standards for 125I and 103Pd
Brachytherapy Seeds
470 kb
Stephen M. Seltzer,
Paul J. Lamperti, Robert Loevinger, Michael G. Mitch, James T. Weaver, and Bert
M. Coursey
http://dx.doi.org/10.6028/jres.109.021
Erratum: Determining the
Magnetic Properties of 1 kg Mass Standards
465 kb
Richard S.
Davis
http://dx.doi.org/10.6028/jres.109.022
Subscription Information 678 kb
(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publications series.)