Journal of Research of
the
National Institute of
Standards and Technology
Volume 109 | Number 1 | January-February 2004 |
Front Cover–Title Page–Contents
1258 kb
http://dx.doi.org/10.6028/jres.109.001
Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers
788 kb
http://dx.doi.org/10.6028/jres.109.002
Polycapillary Optics for Materials Science Studies: Instrumental Effects and Their Correction
1867 kb
http://dx.doi.org/10.6028/jres.109.003
Direct Space Structure Solutions Applications
1309 kb
http://dx.doi.org/10.6028/jres.109.004
Diffraction Line Broadening Analysis if Broadening Is Caused by Both Dislocations and Limited Crystallite Size
588 kb
http://dx.doi.org/10.6028/jres.109.005
X-Ray Spectrometry of Copper: New Results on an Old Subject
1251 kb
http://dx.doi.org/10.6028/jres.109.006
Multidataset Refinement Resonant Diffraction, and Magnetic Structures
668 kb
http://dx.doi.org/10.6028/jres.109.007
Powder Diffraction: Least-Squares and Beyond
752 kb
http://dx.doi.org/10.6028/jres.109.008
Direct Methods Optimised for Solving Crystal Structure by Powder Diffraction Data: Limits, Strategies, and Prospects
524 kb
http://dx.doi.org/10.6028/jres.109.009
The High Resolution Powder Diffraction Beam Line at ESRF
632 kb
http://dx.doi.org/10.6028/jres.109.010
Global Rietveld Refinement
780 kb
http://dx.doi.org/10.6028/jres.109.011
Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles
1178 kb
http://dx.doi.org/10.6028/jres.109.012