Volume 109 Number 1 January-February 2004

Front Cover–Title Page–ContentsPDF File 1258 kb
http://dx.doi.org/10.6028/jres.109.001

Articles

Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers PDF File 788 kb
R. W. Cheary, A. A. Coelho, and J. P. Cline
http://dx.doi.org/10.6028/jres.109.002

Polycapillary Optics for Materials Science Studies: Instrumental Effects and Their Correction PDF File 1867 kb
M. Leoni, U. Welzel, and P. Scardi
http://dx.doi.org/10.6028/jres.109.003

Direct Space Structure Solutions Applications PDF File 1309 kb
Maryjane Tremayne
http://dx.doi.org/10.6028/jres.109.004

Diffraction Line Broadening Analysis if Broadening Is Caused by Both Dislocations and Limited Crystallite Size PDF File 588 kb
J.-D. Kamminga and L. J. Seijbel
http://dx.doi.org/10.6028/jres.109.005

X-Ray Spectrometry of Copper: New Results on an Old Subject PDF File 1251 kb
M. Deutsch, E. Förster, G. Hölzer, J. Härtwig, K. Hämäläinen, C.-C. Kao, D. Huotari, and R. Diamant
http://dx.doi.org/10.6028/jres.109.006

Multidataset Refinement Resonant Diffraction, and Magnetic Structures PDF File 668 kb
J. Paul Attfield
http://dx.doi.org/10.6028/jres.109.007

Powder Diffraction: Least-Squares and Beyond PDF File 752 kb
W. I. F. David
http://dx.doi.org/10.6028/jres.109.008

Direct Methods Optimised for Solving Crystal Structure by Powder Diffraction Data: Limits, Strategies, and Prospects PDF File 524 kb
Angela Altomare, Carmelo Giacovazzo, Anna Grazia Giuseppina Moliterni, and Rosanna Rizzi
http://dx.doi.org/10.6028/jres.109.009

The High Resolution Powder Diffraction Beam Line at ESRF PDF File 632 kb
A. N. Fitch
http://dx.doi.org/10.6028/jres.109.010

Global Rietveld Refinement PDF File 780 kb
Kenneth Shankland
http://dx.doi.org/10.6028/jres.109.011

Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles PDF File 1178 kb
Nicholas Armstrong, Walter Kalceff, James P. Cline, and John Bonevich
http://dx.doi.org/10.6028/jres.109.012