Volume 108 Number 4 July-August 2003

Front Cover–Title Page–ContentsPDF File 1080 kb
http://dx.doi.org/10.6028/jres.108.001

Articles

Review of Instrumented Indentation PDF File 696 kb
Mark R. VanLandingham
http://dx.doi.org/10.6028/jres.108.024

Towards High Accuracy Reflectometry for Extreme-Ultraviolet Lithography PDF File 598 kb
Charles Tarrio, Steven Grantham, Matthew B. Squires, Robert E. Vet, and Thomas B. Lucatorto
http://dx.doi.org/10.6028/jres.108.025

Virtual Environment for Manipulating Microscopic Particles With Optical Tweezers PDF File 707 kb
Yong-Gu Lee, Kevin W. Lyons, Thomas W. LeBrun
http://dx.doi.org/10.6028/jres.108.026

On the Stability of Exponential Backoff PDF File 595 kb
Nah-Oak Song, Byung-Jae Kwak, and Leonard E. Miller
http://dx.doi.org/10.6028/jres.108.027

A Link-Level Simulator of the cdma2000 Reverse-Link Physical Layer PDF File 1088 kb
H. Gharavi, F. Chin, K. Ban, and R. Wyatt-Millington
http://dx.doi.org/10.6028/jres.108.028


News Briefs PDF File 1614 kb
http://dx.doi.org/10.6028/jres.108.029

(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)