Volume 108 Number 2 March-April 2003

Front Cover–Title Page–ContentsPDF File 1080 kb

Articles

Accuracy of Nanoscale Pitch Standards Fabricated by Laser-Focused Atomic Deposition PDF File 1075 kb
Jabez J. McClelland, William R. Anderson, Curtis C. Bradley, Mirek Walkiewicz, Robert J. Celotta, Erich Jurdik, and Richard D. Deslattes
http://dx.doi.org/10.6028/jres.108.0010

Characterization of an Ellipsoidal Radiometer PDF File 725 kb
Annageri V. Murthy, Ingrid Wetterlund, and David P. DeWitt
http://dx.doi.org/10.6028/jres.108.011

Interlaboratory Comparison of Magnetic Thin Film Measurements PDF File 665 kb
F. C. S. da Silva, C. M. Wang, and D. P. Pappas
http://dx.doi.org/10.6028/jres.108.012

A Primary Dead-Weight Tester for Pressures (0.05-1.0) MPa PDF File 561 kb
Kamlesh Jain, Walt Bowers, and James W. Schmidt
http://dx.doi.org/10.6028/jres.108.013

Thermal Conductivity Measurement of an Electron-Beam Physical-Vapor-Deposition Coating PDF File 739 kb
A. J. Slifka and B. J. Filla
http://dx.doi.org/10.6028/jres.108.014

Thermal Evaluation of Scorched Graphite-Epoxy Panels by Infrared Scanning PDF File 572 kb
A. J. Slifka, T. Hall, and E. S. Boltz
http://dx.doi.org/10.6028/jres.108.015



News Briefs PDF File 1173 kb
http://dx.doi.org/10.6028/jres.108.016

(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)