Journal of Research of
the
National Institute of
Standards and Technology
Volume 108 | Number 2 | March-April 2003 |
Front Cover–Title Page–Contents 1080 kb
Accuracy of Nanoscale Pitch Standards Fabricated by Laser-Focused Atomic Deposition
1075 kb
http://dx.doi.org/10.6028/jres.108.0010
Characterization of an Ellipsoidal Radiometer
725 kb
http://dx.doi.org/10.6028/jres.108.011
Interlaboratory Comparison of Magnetic Thin Film Measurements
665 kb
http://dx.doi.org/10.6028/jres.108.012
A Primary Dead-Weight Tester for Pressures (0.05-1.0) MPa
561 kb
http://dx.doi.org/10.6028/jres.108.013
Thermal Conductivity Measurement of an Electron-Beam Physical-Vapor-Deposition Coating
739 kb
http://dx.doi.org/10.6028/jres.108.014
Thermal Evaluation of Scorched Graphite-Epoxy Panels by Infrared Scanning
572 kb
http://dx.doi.org/10.6028/jres.108.015
(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)