Journal of Research of
the
National Institute of
Standards and Technology
Volume 107 | Number 6 | November-December 2002 |
Front
Cover–Title Page–Contents
539 kb
http://dx.doi.org/10.6028/jres.107.001
http://dx.doi.org/10.6028/jres.107.003
http://dx.doi.org/10.6028/jres.107.004
Unertainty in Quantitative Electron Probe Microanalysis
64 kb
http://dx.doi.org/10.6028/jres.107.040
Accurate Cross Sections for Microanalysis
230 kb
http://dx.doi.org/10.6028/jres.107.041
Optimization of Wavelength Dispersive X-ray Spectometry Analysis Conditions
144 kb
http://dx.doi.org/10.6028/jres.107.042
High Count Rate Electron Probe Microanalysis
195 kb
http://dx.doi.org/10.6028/jres.107.043
Decomposition of Wavelength Dispersive X-Ray Spectra
1758 kb
http://dx.doi.org/10.6028/jres.107.044
Limitations to Accuracy in Extracting Characteristic Line Intensities From X-Ray Spectra
573 kb
http://dx.doi.org/10.6028/jres.107.045
Averaging of Backscatter Intensities in Compounds
187 kb
http://dx.doi.org/10.6028/jres.107.046
The Analysis of Particles at Low Accelerating Voltages (< 10 kV) With Energy Dispersive X-Ray Spectroscopy (EDS)
605 kb
http://dx.doi.org/10.6028/jres.107.047
X-Ray Microananlysis in the Variable Pressure (Environmental) Scanning Electron Microscope
3485 kb
http://dx.doi.org/10.6028/jres.107.048
Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy
444 kb
http://dx.doi.org/10.6028/jres.107.049
The Microcalorimeter for Industrial Applications
374 kb
http://dx.doi.org/10.6028/jres.107.050
Sample Preparation for Electron Probe Microanalysis–Pushing the Limits
2115 kb
http://dx.doi.org/10.6028/jres.107.051
Implications of Polishing Techniques in Quantitative X-Ray Microanalysis
3745 kb
http://dx.doi.org/10.6028/jres.107.052
Copper Oxide Precipitates in NBS Standard Reference Material 482
1472 kb
http://dx.doi.org/10.6028/jres.107.053
Smithsonian Microbeam Standards
90 kb
http://dx.doi.org/10.6028/jres.107.054
NIST Standards for Microanalysis and the Certification Process
105 kb
http://dx.doi.org/10.6028/jres.107.055
Contamination in the Rare-Earth Element Orthophosphate Reference Samples
195 kb
http://dx.doi.org/10.6028/jres.107.056
Characterization of Corning EPMA Standard Glasses 95IRV, 95IRW, and 95IRX
301 kb
http://dx.doi.org/10.6028/jres.107.057
Microbeam Characterization of Corning Archeological Reference Glasses: New Additions to the Smithsonian Microbeam Standard Collection
426 kb
http://dx.doi.org/10.6028/jres.107.058
Subject Index to Volume 107 63 kb
Author Index to Volume 107 347 kb
(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)