Volume 107 Number 6 November-December 2002

Front Cover–Title Page–ContentsPDF File 539 kb
http://dx.doi.org/10.6028/jres.107.001
http://dx.doi.org/10.6028/jres.107.003
http://dx.doi.org/10.6028/jres.107.004

Articles

Unertainty in Quantitative Electron Probe Microanalysis PDF File 64 kb
Kurt F. J. Heinrich
http://dx.doi.org/10.6028/jres.107.040

Accurate Cross Sections for Microanalysis PDF File 230 kb
Peter Rez
http://dx.doi.org/10.6028/jres.107.041

Optimization of Wavelength Dispersive X-ray Spectometry Analysis Conditions PDF File 144 kb
Stephen J. B. Reed
http://dx.doi.org/10.6028/jres.107.042

High Count Rate Electron Probe Microanalysis PDF File 195 kb
Joseph D. Geller and Charles Herrington
http://dx.doi.org/10.6028/jres.107.043

Decomposition of Wavelength Dispersive X-Ray Spectra PDF File 1758 kb
Guy Rémond, Robert Myklebust, Michel Fialin, Clive Nockolds, Matthew Phillips, and Claude Roques-Carmes
http://dx.doi.org/10.6028/jres.107.044

Limitations to Accuracy in Extracting Characteristic Line Intensities From X-Ray Spectra PDF File 573 kb
Peter J. Statham
http://dx.doi.org/10.6028/jres.107.045

Averaging of Backscatter Intensities in Compounds PDF File 187 kb
John J. Donovan, Nicholas E. Pingitore, Jr., and Andrew J. Westphal
http://dx.doi.org/10.6028/jres.107.046

The Analysis of Particles at Low Accelerating Voltages (< 10 kV) With Energy Dispersive X-Ray Spectroscopy (EDS) PDF File 605 kb
J. A. Small
http://dx.doi.org/10.6028/jres.107.047

X-Ray Microananlysis in the Variable Pressure (Environmental) Scanning Electron Microscope PDF File 3485 kb
Dale E. Newbury
http://dx.doi.org/10.6028/jres.107.048

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy PDF File 444 kb
Dale E. Newbury
http://dx.doi.org/10.6028/jres.107.049

The Microcalorimeter for Industrial Applications PDF File 374 kb
Del Redfern, Joe Nicolosi, Jens Höhne, Rainer Weiland, Birgit Simmnacher, and Christian Hollerich
http://dx.doi.org/10.6028/jres.107.050

Sample Preparation for Electron Probe Microanalysis–Pushing the Limits PDF File 2115 kb
Joseph D. Geller and Paul D. Engle
http://dx.doi.org/10.6028/jres.107.051

Implications of Polishing Techniques in Quantitative X-Ray Microanalysis PDF File 3745 kb
Guy Rémond, Clive Nockolds, Matthew Phillips, and Claude Roques-Carmes
http://dx.doi.org/10.6028/jres.107.052

Copper Oxide Precipitates in NBS Standard Reference Material 482 PDF File 1472 kb
Eric S. Windsor, Robert A. Carlton, Greg Gillen, Scott A. Wight, and David S. Bright
http://dx.doi.org/10.6028/jres.107.053

Smithsonian Microbeam Standards PDF File 90 kb
Eugene Jarosewich
http://dx.doi.org/10.6028/jres.107.054

NIST Standards for Microanalysis and the Certification Process PDF File 105 kb
R. B. Marinenko
http://dx.doi.org/10.6028/jres.107.055

Contamination in the Rare-Earth Element Orthophosphate Reference Samples PDF File 195 kb
John J. Donovan, John M. Hanchar, Phillip M. Picolli, Marc D. Schrier, Lynn A. Boatner, and Eugene Jarosewich
http://dx.doi.org/10.6028/jres.107.056

Characterization of Corning EPMA Standard Glasses 95IRV, 95IRW, and 95IRX PDF File 301 kb
Paul Carpenter, Dale Counce, Emily Kluk, and Carol Nabelek
http://dx.doi.org/10.6028/jres.107.057

Microbeam Characterization of Corning Archeological Reference Glasses: New Additions to the Smithsonian Microbeam Standard Collection PDF File 426 kb
Edward P. Vicenzi, Stephen Eggins, Amelia Logan, and Richard Wysoczanski
http://dx.doi.org/10.6028/jres.107.058


Indexes to Volume 107

Subject Index to Volume 107 PDF File 63 kb

Author Index to Volume 107 PDF File 347 kb


News Briefs PDF File kb

(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)