Front Cover–Title Page–Contents 29 kb

Articles

Calibration of Electret-Based Integral Radon Monitors Using NIST Polyethylene-Encapsulated ²²⁶Ra/²²²Rn Emanation (PERE) Standards 101 kb
R. Collé, P. Kotrappa, and J. M. R. Hutchinson
http://dx.doi.org/10.6028/jres.100.047

Microstructural Characterization of Cobalt-Tungsten Coated Graphite Fibers 3543 kb
N. S. Wheeler
http://dx.doi.org/10.6028/jres.100.048

On Using Collocation in Three Dimensions and Solving a Model Semiconductor Problem 210 kb
J. F. Marchiando
http://dx.doi.org/10.6028/jres.100.049

Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections 91 kb
A. Jeffery, R. E. Elmquist, and M. E. Cage
http://dx.doi.org/10.6028/jres.100.050

Analysis of the (5d²+5d6s)-5d6p Transition Arrays of Os VII and Ir VIII, and the 6s ²S-6p ²P Transitions of Ir IX 140 kb
G. J. van het Hof, Y. N. Joshi, J. F. Wyart, and J. Sugar
http://dx.doi.org/10.6028/jres.100.051

Application Portability Profile and Open System Environment User's Forum - Conference Report 63 kb
Joseph I. Hungate, Martha M. Gray, and Kathleen A. Liburdy
http://dx.doi.org/10.6028/jres.100.052

International Workshop on Semiconductor Characterization: Present Status and Future Needs - Conference Report 35 kb
D. G. Seiler and T. J. Shaffner
http://dx.doi.org/10.6028/jres.100.053

Metrology Issues in Terahertz Physics and Technology - Conference Report 54 kb
Raju Datla, Erich Grossman, and Mitchell K. Hobish
http://dx.doi.org/10.6028/jres.100.054

Indexes to Volume 100

Subject Index to Volume 100 15 kb

Author Index to Volume 100 109 kb

News Briefs 155 kb
http://dx.doi.org/10.6028/jres.100.055

(The electronic file also contains a Journal of Research subscription form, promotional information, and a description of NIST publication series.)